Editor-in-Chief
Assoc. Prof. Dr. Ilsun You, FIET
Soonchunhyang University, Republic of Korea
Email: ilsunu at gmail.com


Associate Editors-in-Chief
Prof. Dr. Fang-Yie Leu
Tunghai University, Taiwan

Prof. Dr. Jinshu Su
National University of Defense Technology, China

Advisory Board
Mohsen Guizani, University of Idaho, USA 
Willy Susilo, University of Wollongong, Australia
Zita A. Vale, Institute of Engineering-Polytechnic of Porto, Portugal


Editorial Board
Karl Andersson, LuleƄ University of Technology, Sweden
Ruo Ando, NICT, Japan
Aniello Castiglione, University of Salerno, Italy
Hsing-Chung Chen, Asia University, Taiwan
Xiaofeng Chen, Xidian University, China 
Francesco Colace, University of Salerno, Italy
Nicola Dragoni, Technical University of Denmark, Denmark 
Massimo Ficco, Second University of Naples, Italy
Shih-Hao Hung, National Taiwan University, Taiwan
Antonio J. Jara, Univ. of Applied Sci. Western Switzerland (HESSO), Switzerland
Christian Damsgaard Jensen, Technical University of Denmark, Denmark
Zhang Jie, Nanyang Technological University, Singapore 
Shinsaku Kiyomoto, KDDI R&D Laboratories Inc., Japan
Hoon Ko, Institute of Engineering-Polytechnic of Porto, Portugal
Turgay Korkmaz, The University of Texas at San Antonio, USA
Ram Krishnan, The University of Texas at San Antonio, USA
Zhe Liu, University of Waterloo, Canada
Goreti Marreiros, Institute of Engineering-Polytechnic of Porto, Portugal
Francesco Palmieri, University of Salerno, Italy
N.S. Raghava, Delhi Technological University, India
C. Pandu Rangan, IIT Madras, India
Malek Ben Salem, Accenture Technology Labs, USA 
Dongwan Shin, New Mexico Tech, USA
Kunwar Singh, National Institute of Technology, India
Masakazu Soshi, Hiroshima City University, Japan
Zhifeng Xiao, Penn State Behrend, USA
Qin Xin, University of the Faroe Islands, Denmark
Toshihiro Yamauchi, Okayama University, Japan
Kangbin Yim, Soonchunhyang University, Republic of Korea
Siu Ming Yiu, The University of Hong Kong, HK
Meng Yu, The University of Texas at San Antonio, USA
Shui Yu,  Deakin University, Australia
Xin 
Su, Hohai University, China
Xingjun Zhang, Xi'an Jiaotong University, China
Zhiyong (Zeroun) Zhang, Henan University of Science & Technology, China
Baokang Zhao, National University of Defense Technology, China


Editorial Assistance

Vishal Sharma, Soonchunhyang University, Republic of Korea

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